Welcome Page
Qweak
Region 3 Drift Chambers
Construction
Software
DAQ
Internal
Physics
Development and Construction related Topics
Not logged in
Back
|
Find
|
Login
|
Help
Klaus Grimm; MAD Chip homepage
Klaus Grimm; MAD Chip Documentation
Klaus Grimm; MAD Chip 16 Channel Board Photos (INFN)
Klaus Grimm; INFN MAD Chip 16 Channel Board Schematics
Klaus Grimm; Additional MAD Chip information: Slow Control
Klaus Grimm; MAD Chip information: Test Board
Klaus Grimm; Qweak Frontend Electronics
Klaus Grimm; MAD and ASD-8 comparision
Klaus Grimm; CERN Radiation test of MAD Chip
Message ID:
426
Entry time:
05/30/2007 12:51:17 PM
In reply to:
2
Author:
Klaus Grimm 
Type:
Electronics 
Category:
Preamp 
Subject:
CERN Radiation test of MAD Chip 
Record date:
07/09/2004 10:58:32 AM 
CERN did in 1999 and 2000 some extensive radiation tests of the 16 channel INFN front-end electronics board
including 4 MAD chips, preamplifiers, and I2C chips.
In short: Tests were performed with gammas, slow and fast neutrons, and with different types of ions.
Conclusion: no dynamic or static changes found so far.
(For terms and abbreviations like SEL, SEU etc see
http://en.wikipedia.org/wiki/Radiation_hardening
)
(The W&M MAD chips are sometimes called MAD4 or NEWMAD in the reports below)
Link to the radiation damage reports:
http://wwweda.pd.infn.it/cms/DTFB/electronics/frontend/documenti/radiation.pdf
http://wwweda.pd.infn.it/cms/DTFB/electronics/frontend/documenti/rad2000.pdf
Taken from the MAD chip homepage:
http://www.pd.infn.it/cms/DTFB/electronics/frontend/homepage.html
I attached both reports in case the above links don't work anymore.
.
Attachment 1:
radiation.pdf
3.758 MB
Attachment 2:
rad2000.pdf
2.559 MB
ELOG V2.6.0-beta